Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate
Reexamination Certificate
2005-06-16
2009-11-03
Coleman, W. David (Department: 2813)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
C257SE21198, C257S288000
Reexamination Certificate
active
07611973
ABSTRACT:
In methods of selectively forming an epitaxial semiconductor layer on a single crystalline semiconductor and semiconductor devices fabricated using the same, a single crystalline epitaxial semiconductor layer and a non-single crystalline epitaxial semiconductor layer are formed on a single crystalline semiconductor and a non-single crystalline semiconductor pattern respectively, using a main semiconductor source gas and a main etching gas. The non-single crystalline epitaxial semiconductor layer is removed using a selective etching gas. The main gases and the selective etching gas are alternately and repeatedly supplied at least two times to selectively form an elevated single crystalline epitaxial semiconductor layer having a desired thickness only on the single crystalline semiconductor. The selective etching gas suppresses formation of an epitaxial semiconductor layer on the non-single crystalline semiconductor pattern.
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Lee Ho
Lee Seung-Hwan
Rhee Hwa-Sung
Shin Dong-Suk
Ueno Tetsuji
Coleman W. David
McCall-Shepard Sonya D
Mills & Onello LLP
Samsung Electronics Co,. Ltd.
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