Methods of manufacturing semiconductor memory devices

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C438S142000, C438S197000, C438S200000, C438S217000, C438S288000, C257SE21682

Reexamination Certificate

active

07968407

ABSTRACT:
A method of manufacturing a semiconductor memory device, the method including forming a tunnel insulation layer on a substrate, forming a preliminary charge trapping layer on the tunnel insulation layer, forming an etch stop layer on the preliminary charge trapping layer, wherein a portion of the preliminary charge trapping layer is not covered by the etch stop layer, removing the exposed portion of the preliminary charge trapping layer to form a charge trapping layer having a uniform thickness, forming a dielectric layer on the charge trapping layer, and forming a gate electrode on the dielectric layer.

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