Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into... – Plasma
Reexamination Certificate
2009-09-14
2011-11-01
Nhu, David (Department: 2895)
Semiconductor device manufacturing: process
Introduction of conductivity modifying dopant into...
Plasma
C438S197000, C438S719000, C438S753000, C257SE21027, C257SE21042, C257SE21043, C257SE21051, C257SE21058, C257SE21077, C257SE21227, C257SE21231, C257SE21248, C257SE21267, C257SE21247
Reexamination Certificate
active
08048787
ABSTRACT:
Provided are a semiconductor device and a method of forming the same. The method may include forming a gate dielectric layer including a plurality of elements on a substrate; supplying a specific element to the gate dielectric layer; forming a product though reacting the specific element with at least one of the plurality of elements; and removing the product.
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Cho Hag-ju
Hong Hyung-seok
Hyun Sang-jin
Shin Yu-gyun
Myers Bigel Sibley & Sajovec P.A.
Nhu David
Samsung Electronics Co,. Ltd.
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