Methods of forming non-volatile memory device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C438S006000, C438S311000, C438S954000, C438S508000, C438S508000, C438S508000, C438S258000

Reexamination Certificate

active

07611948

ABSTRACT:
A method of forming a non-volatile memory device includes forming first mask patterns, which can have relatively large distances therebetween. A distance regulating layer is formed that conformally covers the first mask patterns. Second mask patterns are formed in grooves on the distance regulating layer between the first mask patterns.

REFERENCES:
patent: 6191975 (2001-02-01), Shimizu et al.
patent: 2003/0127682 (2003-07-01), Lee et al.
patent: 2007/0034938 (2007-02-01), Kang et al.
patent: 2007/0077524 (2007-04-01), Koh et al.
patent: 2000-188384 (2000-07-01), None
patent: 2003-51557 (2003-02-01), None
patent: 10-0190021 (1999-01-01), None
patent: 2003-0060313 (2003-07-01), None
patent: 10-2004-0022996 (2004-03-01), None
patent: 10-0486309 (2005-03-01), None
patent: 10-2005-0101869 (2005-10-01), None
patent: 10-2006-0068908 (2006-06-01), None
patent: 10-2006-0093160 (2006-08-01), None
patent: 10-00655277 (2006-12-01), None
patent: 10-0723769 (2007-05-01), None
Pavan et al., Proceedings of the IEEE, vol. 85, No. 8, Aug. 1997.

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