Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-05-31
2010-10-26
Chen, Jack (Department: 2893)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S591000, C257SE21423
Reexamination Certificate
active
07820514
ABSTRACT:
A method of forming a flash memory device can include forming a tunneling oxide film on a semiconductor substrate, forming a charge storing layer on the tunneling oxide film, forming a first blocking oxide film on the charge storing layer at a first temperature, forming a second blocking oxide film on the first blocking oxide film at a second temperature higher than the first temperature, and forming a gate electrode on the second blocking oxide film.
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patent: 2004/0264236 (2004-12-01), Chae et al.
patent: 11-040682 (1999-02-01), None
patent: 2006-237311 (2006-09-01), None
patent: 10-2000-0001261 (2000-01-01), None
Choi Han-mei
Kim Sun-jung
Lee Seung-hwan
Oh Se-hoon
Ryu Min-Kyung
Chen Jack
Myers Bigel Sibley & Sajovec P.A.
Samsung Electronics Co,. Ltd.
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