Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-12-05
2006-12-05
Blum, David S. (Department: 2813)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S253000
Reexamination Certificate
active
07144771
ABSTRACT:
Methods of forming an electronic device include providing a fist electrode, providing a dielectric oxide layer on the first electrode, and providing a second electrode on the dielectric oxide layer so that the dielectric oxide layer is between the first and second electrodes. More particularly, a first portion of the dielectric oxide layer adjacent the first electrode can have a first density of titanium, and a second portion of the dielectric oxide layer opposite the first electrode can have a second density of titanium different than the first density. Related structures are also discussed.
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English Translation of Korean Notice of Office Action for Korean App. No. 10-2002-0063024, Jul. 28, 2004.
Korean Notice of Office Action for Korean App. No. 10-2002-0063024, Jul. 28, 2004.
Kim Ki-chul
Kim Sung-tae
Kim Young-sun
Lee Seung-hwan
Lim Jae-soon
Blum David S.
Myers Bigel & Sibley & Sajovec
Samsung Electronics Co,. Ltd.
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