Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-05-31
2005-05-31
Lebentritt, Michael S. (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S281000, C438S283000, C438S284000
Reexamination Certificate
active
06900102
ABSTRACT:
A double gate electrode for a field effect transistor is fabricated by forming in a substrate, a trench and a tunnel that extends from a sidewall of the trench parallel to the substrate. An insulating coating is formed inside the tunnel. A bottom gate electrode is formed within the insulating coating inside the tunnel. An insulating layer is formed on the substrate and a top gate electrode is formed on the insulating layer opposite the bottom gate electrode.
REFERENCES:
patent: 6020257 (2000-02-01), Leedy
patent: 6458662 (2002-10-01), Yu
patent: 2002/0114191 (2002-08-01), Iwata et al.
patent: 2004/0016968 (2004-01-01), Coronel et al.
patent: 2004/0063286 (2004-04-01), Kim et al.
patent: 2004/0087162 (2004-05-01), Vogeli
patent: 2004/0108523 (2004-06-01), Chen et al.
patent: 2004/0140520 (2004-07-01), Kim et al.
patent: 2004/0157396 (2004-08-01), Lee et al.
patent: 2004/0209463 (2004-10-01), Kim et al.
patent: 2001-102590 (2001-04-01), None
Choi Si-Young
Jung In-Soo
Lee Byeong-Chan
Lee Deok-Hyung
Yoo Jong-Ryeol
Lebentritt Michael S.
Lindsay Jr. Walter L.
Myers Bigel & Sibley & Sajovec
Samsung Electronics Co,. Ltd.
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