Methods of forming double gate electrodes using tunnel and...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S281000, C438S283000, C438S284000

Reexamination Certificate

active

06900102

ABSTRACT:
A double gate electrode for a field effect transistor is fabricated by forming in a substrate, a trench and a tunnel that extends from a sidewall of the trench parallel to the substrate. An insulating coating is formed inside the tunnel. A bottom gate electrode is formed within the insulating coating inside the tunnel. An insulating layer is formed on the substrate and a top gate electrode is formed on the insulating layer opposite the bottom gate electrode.

REFERENCES:
patent: 6020257 (2000-02-01), Leedy
patent: 6458662 (2002-10-01), Yu
patent: 2002/0114191 (2002-08-01), Iwata et al.
patent: 2004/0016968 (2004-01-01), Coronel et al.
patent: 2004/0063286 (2004-04-01), Kim et al.
patent: 2004/0087162 (2004-05-01), Vogeli
patent: 2004/0108523 (2004-06-01), Chen et al.
patent: 2004/0140520 (2004-07-01), Kim et al.
patent: 2004/0157396 (2004-08-01), Lee et al.
patent: 2004/0209463 (2004-10-01), Kim et al.
patent: 2001-102590 (2001-04-01), None

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