Methods of forming capacitors

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S251000, C257SE21008

Reexamination Certificate

active

07374993

ABSTRACT:
A method of forming a capacitor includes forming a first capacitor electrode over a semiconductor substrate. A capacitor dielectric region is formed onto the first capacitor electrode. The capacitor dielectric region has an exposed oxide containing surface. The exposed oxide containing surface of the capacitor dielectric region is treated with at least one of a borane or a silane. A second capacitor electrode is deposited over the treated oxide containing surface. The second capacitor electrode has an inner metal surface contacting against the treated oxide containing surface. Other aspects and implementations are contemplated.

REFERENCES:
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patent: 6399522 (2002-06-01), Tsan et al.
patent: 6475854 (2002-11-01), Narwankar et al.
patent: 6605530 (2003-08-01), Nakamura et al.
patent: 6784478 (2004-08-01), Merchant et al.
patent: 6853540 (2005-02-01), Kudoh et al.
patent: 7172946 (2007-02-01), Choi et al.
patent: 2002/0098646 (2002-07-01), Hirano et al.

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