Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-11-03
2009-06-02
Richards, N Drew (Department: 2895)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S780000, C438S793000, C438S794000, C438S149000, C257SE21041, C257SE21049, C257SE21005
Reexamination Certificate
active
07541234
ABSTRACT:
Integrated circuit transistors may be fabricated by simultaneously removing a photoresist layer on a first active area of an integrated circuit substrate and a carbon-containing layer on a second active area of the integrated circuit substrate, to expose a nitride stress-generating layer on the second active area. A single mask may be used to define the second active area for removal of the photoresist layer on the first active area and for implanting source/drain regions into the second active area.
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Chang Chong Kwang
Ko Young Gun
Kwon O Sung
Lipinski Matthias
Mishra Shailendra
Chartered Semiconductor Manufacturing Ltd.
Infineon - Technologies AG
Myers Bigel Sibley & Sajovec P.A.
Richards N Drew
Samsung Electronics Co,. Ltd.
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