Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-06-29
2009-02-24
Trinh, Michael (Department: 2822)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S263000, C438S264000
Reexamination Certificate
active
07494868
ABSTRACT:
A method of fabricating a flash memory device. Parallel mask patterns are formed on a substrate. The substrate is etched using the mask patterns to form trenches. An insulating layer pattern is formed in the trenches and an area between the mask patterns. The mask patterns are removed to expose an upper sidewall of the insulating layer pattern that protrudes away from a top surface of the substrate. The insulating layer pattern is isotropically etched to form sloped sidewalls that protrude away from the top surface of the substrate.
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Translation of Korean Office Action dated Jun. 23, 2004, 3 pages.
Choi Jeong-hyuk
Shin Jin-hyun
Shin Wang-chul
Myers Bigel Sibley & Sajovec P.A.
Samsung Electronics Co,. Ltd.
Trinh Michael
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