Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Multiple layers
Reexamination Certificate
2006-01-31
2006-01-31
Coleman, W. David (Department: 2823)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Multiple layers
Reexamination Certificate
active
06992019
ABSTRACT:
Improved methods are disclosed for catalyst-assisted atomic layer deposition (ALD) to form a silicon dioxide layer having superior properties on a semiconductor substrate by using a first reactant component consisting of a silicon compound having at least two silicon atoms, or using a tertiary aliphatic amine as the catalyst component, or both in combination, together with related purging methods and sequencing.
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Chu Kang-soo
Lee Joo-won
Park Jae-eun
Yang Jong-ho
Coleman W. David
Mills & Onello LLP
Samsung Electronics Co,. Ltd.
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