Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-12-25
2007-12-25
Lamarre, Guy (Department: 2112)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S006130, C714S030000, C714S738000, C326S016000, C324S073100
Reexamination Certificate
active
10708380
ABSTRACT:
Systems, methods and apparatus are provided for isolating a defect in a scan chain. The invention includes modifying a first test mode of a plurality of latches included in a scan chain, operating the latches in the modified first test mode, and operating the plurality of latches included in the scan chain in a second test mode. A portion of the scan chain adjacent and following a stuck-@-0 or stuck-@-1 fault in the scan chain may store and/or output a value complementary to the value on the output of the previous portion of the scan chain due to the fault. Such values may be unloaded from the scan chain and used for diagnosing (e.g., isolating a defect in) the defective scan chain. Numerous other aspects are provided.
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Huisman Leendert M.
Huott William V.
Kassab Maroun
Motika Franco
Abraham Esaw T.
Dugan & Dugan PC
Lamarre Guy
LeStrange Michael
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