Cleaning and liquid contact with solids – Processes – Including application of electrical radiant or wave energy...
Patent
1997-01-28
1999-12-28
Utech, Benjamin
Cleaning and liquid contact with solids
Processes
Including application of electrical radiant or wave energy...
134 13, 438720, 438723, 438704, 438725, H01L 21302
Patent
active
060067640
ABSTRACT:
The present invention provides a method of removing photoresist from a wafer surface having a bonding pad using a three step clean composed of (1) a wet cleaning the substrate, (2) a F-containing gas high temperature plasma treatment which prevents the corrosion of aluminum contact pad, and (3) completely striping the photoresist strip using an O.sub.2 dry ash. The invention eliminates metal bonding pad corrosion and the completely removes residual photoresist from keyholes.
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Cho Ching-Wen
Chu Po-Tao
Hung Chih-Chien
Lai Chia-Hung
Ackerman Stephen B.
Goudreau George
Saile George O.
Stoffel William J.
Taiwan Semiconductor Manufacturing Company , Ltd.
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