Etching a substrate: processes – Etching of semiconductor material to produce an article...
Reexamination Certificate
2005-06-14
2005-06-14
Ahmed, Shamim (Department: 1765)
Etching a substrate: processes
Etching of semiconductor material to produce an article...
C216S011000, C216S079000, C438S719000, C438S733000, C438S739000
Reexamination Certificate
active
06905616
ABSTRACT:
Micro devices are formed in situ in a high density in a substrate comprising a masked silicon layer over a stop layer of a silicon compound, by anisotropically etching the desired feature in the silicon layer, overetching to form a notch at the silicon-stop layer interface, depositing a protective fluorocarbon polymer layer on the sidewalls and bottom of the etched silicon layer, and isotropically etching to separate the etched feature from the stop layer. This method avoids the problems of stiction common in other methods of forming micro devices.
REFERENCES:
patent: 5683591 (1997-11-01), Offenberg
patent: 6238580 (2001-05-01), Cole et al.
patent: 6304367 (2001-10-01), Battilana et al.
patent: 6334761 (2002-01-01), Tai et al.
patent: 6428713 (2002-08-01), Christenson et al.
patent: 6458615 (2002-10-01), Fedder et al.
patent: 6522457 (2003-02-01), Battilana
patent: 6551849 (2003-04-01), Kenney
patent: 6596988 (2003-07-01), Corso et al.
patent: 6627882 (2003-09-01), Schultz et al.
patent: 6633031 (2003-10-01), Schultz et al.
patent: 2003/0071015 (2003-04-01), Chinn et al.
patent: 2003/0124848 (2003-07-01), Chinn et al.
patent: 2004/0077178 (2004-04-01), Yang et al.
Merry et al., “Method for plasma etching a Dielectric Layer,” U.S. Appl. No. 10/655,231, filed Sep. 3, 2003.
Chinn, et al., “Disposable Barrier Technique for Through Wafer Etching in MEMS,” U.S. Appl. No. 10/274,403, filed Oct. 18, 2002.
Khan Anisul H
Kumar Ajay
Pamarthy Sharma V
Thekdi Sanjay M
Ahmed Shamim
Applied Materials Inc.
Bach Joseph
Moser Patterson & Sheridan LLP
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