Method of producing the source regions of a flash EEPROM memory

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

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438259, H01L 21336

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active

060906650

ABSTRACT:
The field insulation in a flash memory cell is provided by an oxide/polysilicon/oxide sandwich. The memory cell area is reduced by dopant implantation, self-aligned with respect to the word lines of two adjacent memory cells, for producing the source regions and source connections. The field insulation produces a capacitance between the doping region and the polysilicon layer of the insulation layer which improves the read characteristic of the memory cell.

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International Publication No. 83/03167 (Angle), dated Sep. 15, 1983.

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