Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – By reaction with substrate
Reexamination Certificate
2005-03-25
2008-10-14
Whitehead, Jr., Carl (Department: 2813)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
By reaction with substrate
C438S773000, C438S787000
Reexamination Certificate
active
07435690
ABSTRACT:
Method of preparing a silicon dioxide layer by high-temperature oxidation on a substrate of formula Si1-xGexin which x is greater than 0 and less than or equal to 1, the said method comprising the following successive steps:a) at least one additional layer of thickness hyand of overall formula Si1-yGey, in which y is greater than 0 and less than x, is deposited on the said substrate of formula Si1-xGex; andb) the high-temperature oxidation of the said additional layer of overall formula Si1-yGeyis carried out, whereby the said additional layer is completely or partly converted into a layer of silicon oxide SiO2.Method of preparing an optical or electronic component, comprising at least one step for preparing an SiO2layer using the method described above.
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Moriceau Hubert
Mur Pierre
Commissariat a l''Energie Atomique
Jr. Carl Whitehead
McKenna Long & Aldridge LLP
Rodgers Colleen E
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