Method of memory build-in self-test

Details Method of memory build-in self-test Method of memory build-in self-test

2009-05-31

2011-12-20

Ton, David (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S718000

Reexamination Certificate

active

08082477

ABSTRACT:
The present invention discloses a memory build-in self-test comprising steps of: (a) determining whether there is redundant address in the ROM; (b) when there is redundant address for storing standard check code, transferring the coefficient file in the ROM to a predetermined format; (c) producing a self-test logic and a standard check code corresponding to the ROM via design tool; (d) writing the standard check code into the redundant address and generating a new ROM. The present invention can assure that the standard check code and coefficient can be simply revised via corresponding way of Mask Change, so as to detect the damages of ROM by using memory build-in self-test (MBIST) which does not need to remake a whole set of Mask to revise the standard check code outside the ROM, so as to save cost and time, and lower the difficulty to update the product.

REFERENCES:
patent: 5091908 (1992-02-01), Zorian
patent: 7441165 (2008-10-01), Tseng et al.
patent: 2004/0193984 (2004-09-01), Soundron
patent: 2006/0090105 (2006-04-01), Woods

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