Method of manufacturing a semiconductor device with trench...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S287000, C438S424000

Reexamination Certificate

active

06969660

ABSTRACT:
The major surface of a semiconductor substrate of a semiconductor device includes first and second regions and a boundary area therebetween. A first gate insulating film and a first gate electrode are formed in the first region. A second gate insulating film different from the first gate insulating film and a second gate electrode are formed in the second region. A device isolation region is formed in the boundary area. This device isolation region includes a trench formed in the major surface, and an insulating layer having a portion buried in the trench and a portion projecting upward from the major surface. The bottom of the trench has depths different with portions.

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U.S. Appl. No. 10/058,946, filed Jan. 30, 2002, Gode et al.
Y. Takeuchi, et al., “A Self-Aligned STI Process Integration for Low Cost and Highly Reliable 1Gbit Flash Memories”, VLSI Technology Digest of Technical Papers, 1998, pp. 102-103.

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