4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Field effect device
  6. Having insulated electrode

Mitsuhiro Noguchi

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Data memory system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Reexamination Certificate

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Data memory system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Reexamination Certificate

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Data storage system

Static information storage and retrieval – Floating gate – Particular connection
Reexamination Certificate

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Data storage system with enhanced reliability with respect...

Static information storage and retrieval – Floating gate – Particular connection
Reexamination Certificate

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Data writing method for semiconductor memory device and...

Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-948195

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