Method of manufacturing a semiconductor device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C257SE21679

Reexamination Certificate

active

07932149

ABSTRACT:
In a method of manufacturing a semiconductor device, a tunnel insulation layer is formed on a substrate. A charge trapping layer is formed on the tunnel insulation layer. A protection layer pattern or a mold is formed on the charge trapping layer. Charge trapping layer patterns are formed on the tunnel insulation layer by etching the charge trapping layer using the protection layer pattern or the mold. The charge trapping layer patterns may be spaced apart from each other. Blocking layers are formed on the charge trapping layer patterns, respectively. A gate electrode is formed on the blocking layers and the tunnel insulation layer using the protection layer pattern or the mold.

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patent: 2007/0187749 (2007-08-01), Sugimae et al.
patent: 2009/0045445 (2009-02-01), Yang et al.
patent: 2002-237540 (2002-08-01), None
patent: 10-0532352 (2005-11-01), None

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