Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-06-27
2006-06-27
Lindsay, Jr., Walter L. (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S232000, C438S530000
Reexamination Certificate
active
07067370
ABSTRACT:
A method of manufacturing a transistor of a semiconductor device is provided. The method includes forming an N type gate pattern and a P type gate pattern on a substrate, implanting N type impurities into an N type transistor area, forming an insulation layer on the substrate including the N type gate pattern, forming a first spacer on a sidewall of the P type gate pattern by partially etching the insulation layer in a P type transistor area, and implanting P type impurities into the P type gate pattern and into the P type transistor area, thereby forming a CMOS transistor on the substrate. Thus, damage to the substrate and the transistor is prevented, thereby improving electrical characteristics of the transistor.
REFERENCES:
patent: 5015595 (1991-05-01), Wollesen
patent: 5872047 (1999-02-01), Lee et al.
patent: 0057380 (1999-07-01), None
English Abstract***.
Jung Jin-Suk
Lee Dong-Hun
F. Chau & Associates LLC
Lindsay Jr. Walter L.
Samsung Electronics Co,. Ltd.
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