Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate
2007-06-12
2007-06-12
Niebling, John F. (Department: 2812)
Static information storage and retrieval
Read/write circuit
Differential sensing
C438S276000, C438S277000, C438S278000
Reexamination Certificate
active
09685361
ABSTRACT:
A method for fabricating a semiconductor memory device is described. An insulating layer is disposed on a semiconductor substrate. A matrix of semiconductor memory elements is disposed in the substrate. The semiconductor memory elements include a plurality of contact holes formed in the insulating layer. One contact hole is formed in the insulating layer for each of the semiconductor memory elements. A bit definition region is disposed in the semiconductor substrate underneath each of the contact holes. A contact plug is disposed in each of the contact holes and is in electrical contact with the bit definition region. The bit definition region is configured such that a contact resistance between the semiconductor substrate and the contact plug defines a bit to be stored in the semiconductor memory elements, An evaluation circuit is connected to and evaluates the contact resistance of the semiconductor memory elements.
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Otani Yoichi
Rothenhäusser Steffen
Rusch Andreas
Truby Alexander
Zimmermann Ulrich
Greenberg Laurence A.
Gurley Lynne
Infineon - Technologies AG
Locher Ralph E.
Niebling John F.
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