Method of holding substrate and substrate holding system

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With workpiece support

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C156S345510, C156S345520, C156S345540, C118S724000, C118S728000, C118S500000, C279S128000, C361S234000

Reexamination Certificate

active

06899789

ABSTRACT:
A method and system of holding a substrate to decrease foreign substances on the back surface thereof. The substrate holding system includes a ring-shaped leakage-proof surface having a smooth surface on the specimen table corresponding to the periphery of the substrate, contact holding portions within the periphery of the substrate, and electrostatic attraction means for fixing the substrate by contacting the back surface thereof to the ring-shaped leakage-proof surface and the contact holding portions. The substrate contacts a cooling surface at the ring-shaped leakage-proof surface and the contact holding portion placed on a position inside the ring-shaped leakage-proof surface. The back surface of the substrate and the cooling surface do not contact each other in the large portion of the remaining area.

REFERENCES:
patent: 4565601 (1986-01-01), Kakehi et al.
patent: 5160152 (1992-11-01), Toraguchi et al.
patent: 5213349 (1993-05-01), Elliot
patent: 5310453 (1994-05-01), Fukasawa et al.
patent: 5320982 (1994-06-01), Tsubone et al.
patent: 5443689 (1995-08-01), Kimura et al.
patent: 5474614 (1995-12-01), Robbins
patent: 5516367 (1996-05-01), Lei et al.
patent: 5522131 (1996-06-01), Steger
patent: 5531835 (1996-07-01), Fodor et al.
patent: 5583736 (1996-12-01), Anderson et al.
patent: 5656093 (1997-08-01), Burkhart et al.
patent: 5748435 (1998-05-01), Parkhe
patent: 5792304 (1998-08-01), Tamura et al.
patent: 5906684 (1999-05-01), Tamura et al.
patent: 5961774 (1999-10-01), Tamura et al.
patent: 5985035 (1999-11-01), Tamura et al.
patent: 6048434 (2000-04-01), Tamura et al.
patent: 6217705 (2001-04-01), Tamura et al.
patent: 6221201 (2001-04-01), Tamura et al.
patent: 6336991 (2002-01-01), Tamura et al.
patent: 6524428 (2003-02-01), Tamura et al.
patent: 6544379 (2003-04-01), Tamura et al.
patent: 6610170 (2003-08-01), Tamura et al.
patent: 6610171 (2003-08-01), Tamura et al.
patent: 6645871 (2003-11-01), Tamura et al.
patent: 6676805 (2004-01-01), Tamura et al.
patent: 2001/0025608 (2001-10-01), Tamura et al.
patent: 2002/0046706 (2002-04-01), Tamura et al.
patent: 2002/0096116 (2002-07-01), Tamura et al.
patent: 2002/0104618 (2002-08-01), Tamura et al.
patent: 2002/0108574 (2002-08-01), Tamura et al.
patent: 2003/0192647 (2003-10-01), Tamura et al.
patent: 074 691 (1983-03-01), None
patent: 0357424 (1989-08-01), None
patent: 452 222 (1991-11-01), None
patent: 0 644 578 (1995-03-01), None
patent: 0 644 578 (1995-03-01), None
patent: 5832410 (1983-02-01), None
patent: 62-193141 (1987-08-01), None
patent: 01-251735 (1989-10-01), None
patent: 02-120832 (1990-05-01), None
patent: 02-135753 (1990-05-01), None
patent: 2-135753 (1990-05-01), None
patent: 03-102820 (1991-04-01), None
patent: 03-169041 (1991-07-01), None
patent: 04-003927 (1992-01-01), None
patent: 04-211146 (1992-08-01), None
patent: 04-249341 (1992-09-01), None
patent: 05-006933 (1993-01-01), None
patent: 05-47906 (1993-02-01), None
patent: 05-047906 (1993-02-01), None
patent: 5226292 (1993-03-01), None
patent: 05-175318 (1993-07-01), None
patent: 05-226292 (1993-09-01), None
patent: 05-234944 (1993-09-01), None
patent: 7-94496 (1995-04-01), None
patent: 7-263528 (1995-10-01), None
patent: 2000-114359 (2000-04-01), None
patent: 2001-223258 (2001-08-01), None
IBM Technical Disclosure Bulletin, “Electrostatic Wafer Holder for Wafer Cooling During Reactive Ion Etching,” vol. 31, No. 1, Jun. 1988.
“Vakuumtechnik” W. Pupp—H.K. Hartmann 1991.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of holding substrate and substrate holding system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of holding substrate and substrate holding system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of holding substrate and substrate holding system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3405580

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.