Method of forming silicon-containing insulation film having...

Semiconductor device manufacturing: process – Radiation or energy treatment modifying properties of...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S099000, C438S308000, C438S378000, C438S778000, C438S780000, C257S040000, C257S642000, C257SE51007, C257SE51046, C257SE27117

Reexamination Certificate

active

07655577

ABSTRACT:
A method for forming a silicon-containing insulation film on a substrate by plasma polymerization includes: introducing a reaction gas comprising (i) a source gas comprising a silicon-containing hydrocarbon cyclic compound containing at least one vinyl group (Si-vinyl compound), and (ii) an additive gas, into a reaction chamber where a substrate is placed; and applying radio-frequency power to the gas to cause plasma polymerization, thereby depositing an insulation film on the substrate.

REFERENCES:
patent: 3822928 (1974-07-01), Smolinsky et al.
patent: 6455445 (2002-09-01), Matsuki
patent: 6596627 (2003-07-01), Mandal
patent: 6649540 (2003-11-01), Wang et al.
patent: 6784123 (2004-08-01), Matsuki
patent: 6818570 (2004-11-01), Tsuji et al.
patent: 6855645 (2005-02-01), Tang et al.
patent: 6897163 (2005-05-01), Gaillard et al.
patent: 7064088 (2006-06-01), Hyodo et al.
patent: 2003/0100175 (2003-05-01), Nobutoki et al.
patent: 2004/0137757 (2004-07-01), Li et al.
patent: 2004/0152338 (2004-08-01), Gaillard et al.
patent: 2001-274153 (2001-10-01), None
Office Action dated Jul. 16, 2008, U.S. Appl. No. 11/550,917, filed Oct. 19, 2006 to Hyodo et al., 14 pages.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of forming silicon-containing insulation film having... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of forming silicon-containing insulation film having..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming silicon-containing insulation film having... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4204190

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.