Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Multiple layers
Reexamination Certificate
2011-04-19
2011-04-19
Nguyen, Khiem D (Department: 2823)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Multiple layers
C438S197000, C438S694000, C438S933000, C257S401000, C257SE21404, C257SE29245, C977S747000, C977S762000, C977S938000
Reexamination Certificate
active
07928017
ABSTRACT:
A method of forming a nanowire and a semiconductor device comprising the nanowire are provided. The method of forming a nanowire includes forming a patterned SiyGe1-ylayer (where, y is a real number that satisfies 0≦y<1) on a base layer, and forming a first oxide layer and at least one nanowire within the first oxide layer by performing a first oxidation process on the patterned SiyGe1-ylayer.
REFERENCES:
patent: 2008/0042120 (2008-02-01), Shibata et al.
patent: 2008/0050918 (2008-02-01), Damlencourt
patent: 2008/0116490 (2008-05-01), Stewart et al.
patent: 2008/0135949 (2008-06-01), Lo et al.
Bae Eun-ju
Jeong Joong S.
Kim Jun-youn
Harness Dickey & Pierce PLC
Kim Su C
Nguyen Khiem D
Samsung Electronics Co,. Ltd.
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