Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Total dielectric isolation
Reexamination Certificate
2011-03-01
2011-03-01
Blum, David S (Department: 2813)
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Total dielectric isolation
C438S412000, C438S424000, C257SE21545, C257SE25029
Reexamination Certificate
active
07897477
ABSTRACT:
Provided is a method of fabricating a semiconductor device that includes providing a semiconductor substrate having a front side and a back side, forming a first circuit and a second circuit at the front side of the semiconductor substrate, bonding the front side of the semiconductor substrate to a carrier substrate, thinning the semiconductor substrate from the back side, and forming an trench from the back side to the front side of the semiconductor substrate to isolate the first circuit from the second circuit.
REFERENCES:
patent: 2005/0212071 (2005-09-01), Yue et al.
patent: 2009/0184357 (2009-07-01), Wu
Hsu Tzu-Hsuan
Wang Ching-Chun
Blum David S
Haynes and Boone LLP
Taiwan Semiconductor Manufacturing Company , Ltd.
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