Method of forming an isolation structure

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Total dielectric isolation

Reexamination Certificate

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Details

C438S412000, C438S424000, C257SE21545, C257SE25029

Reexamination Certificate

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07897477

ABSTRACT:
Provided is a method of fabricating a semiconductor device that includes providing a semiconductor substrate having a front side and a back side, forming a first circuit and a second circuit at the front side of the semiconductor substrate, bonding the front side of the semiconductor substrate to a carrier substrate, thinning the semiconductor substrate from the back side, and forming an trench from the back side to the front side of the semiconductor substrate to isolate the first circuit from the second circuit.

REFERENCES:
patent: 2005/0212071 (2005-09-01), Yue et al.
patent: 2009/0184357 (2009-07-01), Wu

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