Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-04-20
2011-10-11
Smith, Zandra (Department: 2822)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S238000, C438S381000, C257SE21257, C257SE21585, C257SE23145, C257SE45002
Reexamination Certificate
active
08034683
ABSTRACT:
A method of forming a phase change material layer includes preparing a substrate having an insulator and a conductor, loading the substrate into a process housing, injecting a deposition gas into the process housing to selectively form a phase change material layer on an exposed surface of the conductor, and unloading the substrate from the process housing, wherein a lifetime of the deposition gas in the process housing is shorter than a time the deposition gas takes to react by thermal energy.
REFERENCES:
patent: 6545287 (2003-04-01), Chiang
patent: 6566700 (2003-05-01), Xu
patent: 6759267 (2004-07-01), Chen
patent: 7473597 (2009-01-01), Lee et al.
patent: 7663136 (2010-02-01), Park et al.
patent: 2006/0006472 (2006-01-01), Jiang
patent: 2006/0039192 (2006-02-01), Ha et al.
patent: 2006/0076641 (2006-04-01), Cho et al.
patent: 10-2001-0004719 (2001-01-01), None
patent: 10-2004-0044882 (2004-05-01), None
patent: 10-2006-0016418 (2006-02-01), None
patent: 10-2006-0018172 (2006-02-01), None
Cho Sung-Lae
Lee Choong-Man
Lee Jin-Il
Lim Sang-Wook
Park Hye-Young
Lee & Morse P.C.
Perkins Pamela E
Samsung Electronics Co,. Ltd.
Smith Zandra
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