Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2010-04-13
2010-12-14
Purvis, Sue A. (Department: 2826)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C257SE21409
Reexamination Certificate
active
07851287
ABSTRACT:
A Schottky barrier FinFET device and a method of fabricating the same are provided. The device includes a lower fin body provided on a substrate. An upper fin body having first and second sidewalls which extend upwardly from a center of the lower fin body and face each other is provided. A gate structure crossing over the upper fin body and covering an upper surface of the upper fin body and the first and second sidewalls is provided. The Schottky barrier FinFET device includes a source and a drain which are formed on the sidewalls of the upper fin body adjacent to sidewalls of the gate structure and made of a metal material layer formed on an upper surface of the lower fin body positioned at both sides of the upper fin body, and the source and drain form a Schottky barrier to the lower and upper fin bodies.
REFERENCES:
patent: 6303479 (2001-10-01), Snyder
patent: 6492212 (2002-12-01), Ieong et al.
patent: 6744103 (2004-06-01), Snyder
patent: 7119402 (2006-10-01), Kinoshita et al.
patent: 2005/0093033 (2005-05-01), Kinoshita et al.
patent: 2006/0011984 (2006-01-01), Currie
patent: 2007/0007590 (2007-01-01), Kinoshita et al.
patent: 2007/0111435 (2007-05-01), Kim et al.
patent: 2007/0132009 (2007-06-01), Takeuchi et al.
patent: 2003243667 (2003-08-01), None
patent: 2004039694 (2004-02-01), None
patent: 1020040081873 (2004-09-01), None
patent: 1020050025096 (2005-03-01), None
patent: 2005036651 (2005-04-01), None
“Schottky Barrier FiNFET Device and Fabrication Method Thereof” Specification, Drawings, and Prosecution History of U.S. Appl. No. 11/598,374, filed Nov. 13, 2006, by Sung-Min Kim, et al., which is stored in the United States Patent and Trademark Office (USPTO) Image File Wrapper (IFW) system.
Kim Dong-Won
Kim Sung-Min
Yun Eun-Jung
Ahmed Selim
Mills & Onello LLP
Purvis Sue A.
Samsung Electronics Co,. Ltd.
LandOfFree
Method of fabricating Schottky barrier FinFET device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of fabricating Schottky barrier FinFET device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of fabricating Schottky barrier FinFET device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4201184