Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2010-01-13
2011-12-13
Ahmadi, Mohsen (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S267000, C438S268000, C438S424000, C438S446000, C438S637000, C257SE21613, C257SE21614, C257SE21645, C257SE21679, C257SE21681
Reexamination Certificate
active
08076198
ABSTRACT:
A method of fabricating a nonvolatile memory device with a three-dimensional structure includes alternately stacking first and second material layers in two or more layers on a semiconductor substrate, forming trenches penetrating the stacked first and second material layers by performing a first etching process, and removing the second material layers exposed in the trenches by performing a second etching process. The first and second material layers are formed of materials that have the same main component but have different impurity contents, respectively.
REFERENCES:
patent: 7342280 (2008-03-01), Yoo
patent: 7566616 (2009-07-01), Song
patent: 2005/0023599 (2005-02-01), Song
patent: 2006/0154460 (2006-07-01), Yun et al.
patent: 2008/0023749 (2008-01-01), Kim et al.
patent: 2008/0067583 (2008-03-01), Kidoh et al.
patent: 2009/0001419 (2009-01-01), Han et al.
patent: 2009/0233432 (2009-09-01), Song
patent: 2009/0280641 (2009-11-01), Kang et al.
patent: 2010/0001336 (2010-01-01), Maruyama et al.
patent: 2010/0038699 (2010-02-01), Katsumata et al.
patent: 2010/0117047 (2010-05-01), Tanaka et al.
patent: 2010/0117137 (2010-05-01), Fukuzumi et al.
patent: 2010/0176440 (2010-07-01), Omura
patent: 4-340270 (1992-11-01), None
patent: 10-0559995 (2006-03-01), None
patent: 10-0855990 (2008-08-01), None
Bae Sang Won
Kang Dae-hyuk
Kim Dong-hyun
Kim Young-Hoo
Kim Young-ok
Ahmadi Mohsen
Onello & Mello LLP
Samsung Electronics Co,. Ltd.
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