Method of fabricating nanowire memory device and system of...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C365S151000, C257SE51039

Reexamination Certificate

active

07985646

ABSTRACT:
A method of fabricating a nanowire memory device, and a system of controlling nanowire formation used in the same method are provided. In the method of fabricating a nanowire memory device which includes a substrate; an electrode formed on the substrate and insulated from the substrate; and a nanowire having its one end connected with the electrode and formed at a given length, the method comprises: forming an electrode and a dummy electrode to be paired with the electrode on the substrate; forming the nanowire between the electrode and the dummy electrode while measuring a current flowing between the electrode and the dummy electrode, and cutting power applied between the electrode and the dummy electrode when the current measured is a given value; and removing the dummy electrode.

REFERENCES:
patent: 6719602 (2004-04-01), Nakayama et al.
patent: 6874668 (2005-04-01), Cumings et al.
patent: 7256063 (2007-08-01), Pinkerton et al.
patent: 7382648 (2008-06-01), Bockrath
patent: 7405420 (2008-07-01), Wong et al.
patent: 2007/0268739 (2007-11-01), Yoo et al.

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