4. Computer-aided design and analysis of circuits and semiconductor
  5. Nanotechnology related integrated circuit design

Cadence Design (Israel) II Ltd.

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Method and apparatus for maximizing and managing test coverage

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Method and system for automatically creating tests

Data processing: software development – installation – and managem – Software program development tool – Testing or debugging
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Method for providing bitwise constraints for test generation

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Race condition detection and expression

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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System and method for visual debugging of constraint systems

Data processing: software development – installation – and managem – Software program development tool – Testing or debugging
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