Method for manufacturing a semiconductor device having a ferroel

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

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438 3, 438253, 438396, H01L 218242, H01L 2120, H01L 2100

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active

058343482

ABSTRACT:
In a semiconductor device having a ferroelectric capacitor and manufacturing method thereof, a spacer comprising a low dielectric constant material is formed on the side surfaces of a plurality of lower electrodes separated into each cell unit, and a ferroelectric film is formed on the lower electrodes whereon the low dielectric constant material spacer is formed, and an upper electrode is formed on the ferroelectric film, to thereby prevent an error which may be caused between the adjacent lower electrodes.

REFERENCES:
patent: 4839305 (1989-06-01), Bughlon
patent: 4971924 (1990-11-01), TigeLaar et al.
patent: 5010028 (1991-04-01), Gill et al.
patent: 5156993 (1992-10-01), Su
patent: 5206788 (1993-04-01), Larson
patent: 5216572 (1993-06-01), Larson et al.
patent: 5262343 (1993-11-01), Rhodes et al.
patent: 5335138 (1994-08-01), Sandhu et al.
patent: 5365095 (1994-11-01), Shono et al.
patent: 5371700 (1994-12-01), Hamada
patent: 5416735 (1995-05-01), Onishi et al.
patent: 5439840 (1995-08-01), Jones, Jr.
patent: 5440157 (1995-08-01), Imai et al.
patent: 5486713 (1996-01-01), Koyama
patent: 5489548 (1996-02-01), Nishioka et al.
patent: 5534458 (1996-07-01), Okudaira
patent: 5554564 (1996-09-01), Nishioka et al.
patent: 5567964 (1996-10-01), Kashihara et al.
patent: 5641702 (1997-06-01), Kimai et al.
patent: 5717236 (1998-02-01), Shinkawata
Wolf et al.; "Chemical Vapor Deposition of Amorphous and Polycrystalline Films," Silicon Processing for the VLSI Era-vol. 1; CA, Lattice Press; 1986; p. 191.
Wolf et al; "Multilevel--Interconnect Technology for VLSI and ULSI," Silicon Processing for the VLSI Era-vol. 2; CA, Lattice Press; 1990; pp. 199-203.

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