Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2011-01-25
2011-01-25
Ghyka, Alexander G (Department: 2812)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S631000, C438S637000, C257SE21581, C257SE23144
Reexamination Certificate
active
07875548
ABSTRACT:
Methods of fabricating semiconductor structures on a substrate, where the substrate has transistors formed thereon, are provided. One method includes forming interconnect metallization structures in a plurality of levels. The forming of the interconnect metallization structures includes depositing a sacrificial layer and performing a process to etch trenches, vias, and stubs into the sacrificial layer. The method further includes filling and planarizing the trenches, vias, and stubs that were etched and then etching away the sacrificial layer throughout the plurality of levels of the interconnect metallization structures. The etching leaving a voided interconnect metallization structure that is structurally supported by stubs that are non-electrically functional.
REFERENCES:
patent: 5219791 (1993-06-01), Freiberger
patent: 6064118 (2000-05-01), Sasaki
Gotkis Yehiel
Kistler Rodney
Wei David
Ghyka Alexander G
Lam Research Corporation
Martine & Penilla & Gencarella LLP
LandOfFree
Method for making semiconductor structures implementing... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for making semiconductor structures implementing..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for making semiconductor structures implementing... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2705709