Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-01-10
2006-01-10
Le, Dung A. (Department: 2818)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S003000, C438S593000, C257S530000, C367S065000, C367S117000
Reexamination Certificate
active
06984561
ABSTRACT:
An improved method for fabricating a three dimensional monolithic memory with increased density. The method includes forming conductors preferably comprising tungsten, then filling and planarizing; above the conductors forming semiconductor elements preferably comprising two diode portions and an antifuse, then filling and planarizing; and continuing to form conductors and semiconductor elements in multiple stories of memories. The arrangement of processing steps and the choice of materials decreases aspect ratio of each memory cell, improving the reliability of gap fill and preventing etch undercut.
REFERENCES:
patent: 6034882 (2000-03-01), Johnson et al.
patent: 6111784 (2000-08-01), Nishimura
patent: 6483736 (2002-11-01), Johnson et al.
patent: 6525953 (2003-02-01), Johnson
patent: 6567301 (2003-05-01), Anthony et al.
patent: 6584029 (2003-06-01), Tran et al.
patent: 6642603 (2003-11-01), Knall
patent: 6693823 (2004-02-01), Brown
patent: 6777773 (2004-08-01), Knall
Herner S. Brad
Mahajani Maitreyee
Le Dung A.
Matrix Semiconductor Inc.
Matrix Semiconductor, Inc.
Squyres Pamela J.
LandOfFree
Method for making high density nonvolatile memory does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for making high density nonvolatile memory, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for making high density nonvolatile memory will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3528911