Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-06-07
2005-06-07
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
06904585
ABSTRACT:
A method for identifying and modifying, in a VLSI chip design, wire routes within a region of wiring congestion that can be routed around that region without inducing timing violations by the insertion and proper placement of inverters. Circuits and nets are examined in the vicinity of the wiring congestion to determine those nets with high potential to drive a route outside the region. Circuit locations are analyzed to determine if the net connecting them creates a path through the region of wiring congestion. Timing slacks are derived from the timing reports for such nets and compared against a timing value representing the additional delay of using an inverter pair to drive the wire route outside the region of wiring congestion. If a net has sufficient timing slack, it is buffered with an inverter pair which is then placed in a manner as to force the wire routes for the modified path around the region of wiring congestion, thereby reducing the wire utilization within the region.
REFERENCES:
patent: 6205571 (2001-03-01), Camporese et al.
patent: 6205572 (2001-03-01), Dupenloup
patent: 6577165 (2003-06-01), Cheung et al.
patent: 6701507 (2004-03-01), Srinivasan
Brittain Mark A.
Klapproth Kenneth D.
Le Vu T.
Palumbo Joseph J.
Augspurger Lynn A.
International Business Machines - Corporation
Siek Vuthe
LandOfFree
Method for identification and removal of non-timing critical... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for identification and removal of non-timing critical..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for identification and removal of non-timing critical... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3503319