4. Electrical computers and digital processing systems: memory
  5. Storage accessing and control
  6. Specific memory composition

Mark A. Brittain

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Memory wrap test mode using functional read/write buffers

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Method for identification and removal of non-timing critical...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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System to enable a memory hub device to manage thermal...

Electrical computers and digital processing systems: memory – Storage accessing and control – Specific memory composition
Reexamination Certificate

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System to increase the overall bandwidth of a memory channel...

Electrical computers and digital processing systems: memory – Storage accessing and control – Specific memory composition
Reexamination Certificate

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System to provide memory system power reduction without...

Electrical computers and digital processing systems: memory – Storage accessing and control – Specific memory composition
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Profile ID: LFUS-PAI-P-2200783

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