Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – By reaction with substrate
Reexamination Certificate
2006-01-31
2006-01-31
Ghyka, Alexander (Department: 2812)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
By reaction with substrate
C438S724000, C438S776000
Reexamination Certificate
active
06992021
ABSTRACT:
A method of forming a silicon nitride layer. The method comprises providing a substrate having a silicon surface thereon, performing an ion implant process on the silicon surface, implanting nitrogen atoms into the silicon surface, and performing a thermal nitridation process and forming a silicon nitride layer on the substrate, wherein the silicon nitride layer comprises the silicon nitride formed on the silicon surface by reaction of the silicon surface with the nitrogen atoms contained therein.
REFERENCES:
patent: 5663087 (1997-09-01), Yokozawa
patent: 6060403 (2000-05-01), Yasuda et al.
patent: 6716757 (2004-04-01), Lin et al.
Hung Hai-Han
Lee Chung-Yuan
Lin Shian-Jyh
Ghyka Alexander
Nanya Technology Corporation
Quintero Law Office
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