Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-06-15
2010-12-28
Richards, N Drew (Department: 2895)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S183000, C438S321000, C438S926000, C257SE21434, C257SE21444, C257SE21453, C257S240000, C257S241000, C257S242000, C257S243000, C257S224000, C257SE21023, C257SE21060
Reexamination Certificate
active
07858481
ABSTRACT:
A method of fabricating a MOS transistor having a thinned channel region is described. The channel region is etched following removal of a dummy gate. The source and drain regions have relatively low resistance with the process.
REFERENCES:
patent: 4711701 (1987-12-01), McLevige
patent: 4906589 (1990-03-01), Chao
patent: 4996574 (1991-02-01), Shirasaki et al.
patent: 5124777 (1992-06-01), Lee et al.
patent: 5266518 (1993-11-01), Binsma et al.
patent: 5338959 (1994-08-01), Kim et al.
patent: 5346839 (1994-09-01), Sundaresan
patent: 5391506 (1995-02-01), Tada et al.
patent: 5466621 (1995-11-01), Hisamoto et al.
patent: 5521859 (1996-05-01), Ema et al.
patent: 5545586 (1996-08-01), Koh
patent: 5563077 (1996-10-01), Ha et al.
patent: 5576227 (1996-11-01), Hsu
patent: 5578513 (1996-11-01), Maegawa
patent: 5658806 (1997-08-01), Lin et al.
patent: 5693542 (1997-12-01), Suh et al.
patent: 5701016 (1997-12-01), Burroughs et al.
patent: 5716879 (1998-02-01), Choi et al.
patent: 5814544 (1998-09-01), Huang
patent: 5814895 (1998-09-01), Hirayama
patent: 5821629 (1998-10-01), Wen et al.
patent: 5827769 (1998-10-01), Aminzadeh et al.
patent: 5856225 (1999-01-01), Lee et al.
patent: 5888309 (1999-03-01), Yu
patent: 5889304 (1999-03-01), Watanabe et al.
patent: 5905285 (1999-05-01), Gardner et al.
patent: 5908313 (1999-06-01), Chau et al.
patent: 5985726 (1999-11-01), Yu et al.
patent: 6010921 (2000-01-01), Soutome
patent: 6054355 (2000-04-01), Inumiya et al.
patent: 6087208 (2000-07-01), Krivokapic et al.
patent: 6093947 (2000-07-01), Hanafi et al.
patent: 6114206 (2000-09-01), Yu
patent: 6117741 (2000-09-01), Chatterjee et al.
patent: 6124177 (2000-09-01), Lin et al.
patent: 6163053 (2000-12-01), Kawashima
patent: 6200865 (2001-03-01), Gardner et al.
patent: 6251763 (2001-06-01), Inumiya et al.
patent: 6252284 (2001-06-01), Muller et al.
patent: 6262456 (2001-07-01), Yu et al.
patent: 6319807 (2001-11-01), Yeh et al.
patent: 6346450 (2002-02-01), Deleonibus et al.
patent: 6358800 (2002-03-01), Tseng
patent: 6376317 (2002-04-01), Forbes et al.
patent: 6391782 (2002-05-01), Yu
patent: 6396108 (2002-05-01), Krivokapic et al.
patent: 6407442 (2002-06-01), Inoue et al.
patent: 6413802 (2002-07-01), Hu et al.
patent: 6413877 (2002-07-01), Annapragada
patent: 6465290 (2002-10-01), Suguro et al.
patent: 6475869 (2002-11-01), Yu
patent: 6475890 (2002-11-01), Yu
patent: 6479866 (2002-11-01), Xiang
patent: 6483151 (2002-11-01), Wakabayashi et al.
patent: 6483156 (2002-11-01), Adkisson et al.
patent: 6525403 (2003-02-01), Inaba et al.
patent: 6562665 (2003-05-01), Yu
patent: 6562687 (2003-05-01), Deleonibus et al.
patent: 6566734 (2003-05-01), Sugihara et al.
patent: 6605498 (2003-08-01), Murthy et al.
patent: 6611029 (2003-08-01), Ahmed et al.
patent: 6635909 (2003-10-01), Clark et al.
patent: 6645797 (2003-11-01), Buynoski et al.
patent: 6660598 (2003-12-01), Hanafi et al.
patent: 6680240 (2004-01-01), Maszara
patent: 6706571 (2004-03-01), Yu et al.
patent: 6709982 (2004-03-01), Buynoski et al.
patent: 6713396 (2004-03-01), Anthony
patent: 6716684 (2004-04-01), Krivokapic et al.
patent: 6716690 (2004-04-01), Wang et al.
patent: 6730964 (2004-05-01), Horiuchi
patent: 6756657 (2004-06-01), Zhang et al.
patent: 6764884 (2004-07-01), Yu et al.
patent: 6774390 (2004-08-01), Sugiyama et al.
patent: 6784076 (2004-08-01), Gonzalez et al.
patent: 6790733 (2004-09-01), Natzle et al.
patent: 6794313 (2004-09-01), Chang
patent: 6800885 (2004-10-01), An et al.
patent: 6830998 (2004-12-01), Pan et al.
patent: 6835618 (2004-12-01), Dakshina-Murthy et al.
patent: 6838322 (2005-01-01), Pham et al.
patent: 6852559 (2005-02-01), Kwak et al.
patent: 6858478 (2005-02-01), Chau et al.
patent: 6864540 (2005-03-01), Divakaruni et al.
patent: 6867433 (2005-03-01), Yeo et al.
patent: 6869868 (2005-03-01), Chiu et al.
patent: 6884154 (2005-04-01), Mizushima et al.
patent: 6921982 (2005-07-01), Joshi et al.
patent: 6974738 (2005-12-01), Hareland
patent: 6975014 (2005-12-01), Krivokapic et al.
patent: 6977415 (2005-12-01), Matsuo
patent: 6998301 (2006-02-01), Yu et al.
patent: 6998318 (2006-02-01), Park
patent: 7041601 (2006-05-01), Yu et al.
patent: 7045407 (2006-05-01), Keating et al.
patent: 7056794 (2006-06-01), Ku et al.
patent: 7247547 (2007-07-01), Zhu et al.
patent: 7354817 (2008-04-01), Watanabe et al.
patent: 7396730 (2008-07-01), Li
patent: 7615429 (2009-11-01), Kim et al.
patent: 2001/0026985 (2001-10-01), Kim et al.
patent: 2002/0011612 (2002-01-01), Hieda
patent: 2002/0036290 (2002-03-01), Inaba et al.
patent: 2002/0037619 (2002-03-01), Sugihara et al.
patent: 2002/0081794 (2002-06-01), Ito
patent: 2002/0142529 (2002-10-01), Matsuda et al.
patent: 2002/0166838 (2002-11-01), Nagarajan
patent: 2002/0167007 (2002-11-01), Yamazaki et al.
patent: 2003/0042542 (2003-03-01), Maegawa et al.
patent: 2003/0057486 (2003-03-01), Gambino et al.
patent: 2003/0067017 (2003-04-01), Ieong et al.
patent: 2003/0085194 (2003-05-01), Hopkins, Jr.
patent: 2003/0098479 (2003-05-01), Murthy et al.
patent: 2003/0098488 (2003-05-01), O'Keeffe et al.
patent: 2003/0102497 (2003-06-01), Fried et al.
patent: 2003/0102518 (2003-06-01), Fried et al.
patent: 2003/0111686 (2003-06-01), Nowak
patent: 2003/0122186 (2003-07-01), Sekigawa et al.
patent: 2003/0143791 (2003-07-01), Cheong et al.
patent: 2003/0151077 (2003-08-01), Mathew et al.
patent: 2003/0190766 (2003-10-01), Gonzalez et al.
patent: 2003/0201458 (2003-10-01), Clark et al.
patent: 2003/0227036 (2003-12-01), Sugiyama et al.
patent: 2004/0029345 (2004-02-01), Deleonibus et al.
patent: 2004/0031979 (2004-02-01), Lochtefeld et al.
patent: 2004/0036118 (2004-02-01), Adadeer et al.
patent: 2004/0036126 (2004-02-01), Chau et al.
patent: 2004/0036127 (2004-02-01), Chau et al.
patent: 2004/0038436 (2004-02-01), Mori et al.
patent: 2004/0061178 (2004-04-01), Lin et al.
patent: 2004/0063286 (2004-04-01), Kim et al.
patent: 2004/0092062 (2004-05-01), Ahmed et al.
patent: 2004/0092067 (2004-05-01), Hanafi et al.
patent: 2004/0094807 (2004-05-01), Chau et al.
patent: 2004/0099903 (2004-05-01), Yeo et al.
patent: 2004/0108558 (2004-06-01), Kwak et al.
patent: 2004/0110097 (2004-06-01), Ahmed et al.
patent: 2004/0119100 (2004-06-01), Nowak et al.
patent: 2004/0124492 (2004-07-01), Matsuo
patent: 2004/0126975 (2004-07-01), Ahmed et al.
patent: 2004/0166642 (2004-08-01), Chen et al.
patent: 2004/0169221 (2004-09-01), Ko et al.
patent: 2004/0180491 (2004-09-01), Arai et al.
patent: 2004/0191980 (2004-09-01), Rios et al.
patent: 2004/0195624 (2004-10-01), Liu et al.
patent: 2004/0197975 (2004-10-01), Krivokapic et al.
patent: 2004/0198003 (2004-10-01), Yeo et al.
patent: 2004/0209463 (2004-10-01), Kim et al.
patent: 2004/0219780 (2004-11-01), Ohuchi
patent: 2004/0227187 (2004-11-01), Cheng et al.
patent: 2004/0238887 (2004-12-01), Nihey
patent: 2004/0256647 (2004-12-01), Lee et al.
patent: 2004/0262683 (2004-12-01), Bohr et al.
patent: 2004/0262699 (2004-12-01), Rios et al.
patent: 2005/0003612 (2005-01-01), Hackler et al.
patent: 2005/0017377 (2005-01-01), Joshi et al.
patent: 2005/0023535 (2005-02-01), Sriram
patent: 2005/0035415 (2005-02-01), Yeo et al.
patent: 2005/0093067 (2005-05-01), Yeo et al.
patent: 2005/0093075 (2005-05-01), Bentum et al.
patent: 2005/0093154 (2005-05-01), Kottantharayil et al.
patent: 2005/0104055 (2005-05-01), Kwak et al.
patent: 2005/0118790 (2005-06-01), Lee et al.
patent: 2005/0127362 (2005-06-01), Zhang et al.
patent: 2005/0145941 (2005-07-01), Bedell et al.
patent: 2005/0153494 (2005-07-01), Ku et al.
patent: 2005/0156171 (2005-07-01), Brask et al.
patent: 2005/0156202 (2005-07-01), Rhee et al.
patent: 2005/0184316 (2005-08-01), Kim et al.
patent: 2005/0189583 (2005-09-01), Kim et al.
patent: 2005/0191795 (2005-09-01), Chidambarrao et al.
patent: 2005/0224797 (2005-10-01), Ko et al.
patent: 2005/0224800 (2005-10-01), Lindert
patent: 2005/0227498 (2005-10-01), Furukawa et al.
patent: 2005/0230763 (2005-10-01), Huang et al.
patent: 2005/0266645 (2005-12-01), Park
patent: 2005/0272192 (2005-12-01), Oh et al.
patent: 2006/0014338 (2006-01-01), Doris et al.
patent: 2006/00685
Brask Justin K.
Chau Robert S.
Datta Suman
Doczy Mark L.
Doyle Brian S.
Blakely , Sokoloff, Taylor & Zafman LLP
Intel Corporation
Richards N Drew
Singal Ankush K
LandOfFree
Method for fabricating transistor with thinned channel does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for fabricating transistor with thinned channel, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for fabricating transistor with thinned channel will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4233080