Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Patent
1998-05-05
2000-09-12
Lund, Jeffrie R
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
438723, 216 17, 216 67, 216 79, C03C 1500, C03C 2500, H01B 1300, H01L 21302
Patent
active
061177865
ABSTRACT:
A semiconductor manufacturing process wherein deep and narrow 0.6 micron and smaller openings are plasma etched in doped and undoped silicon oxide. The etching gas includes fluorocarbon, oxygen and nitrogen reactants which cooperate to etch the silicon oxide while providing enough polymer build-up to obtain anisotropically etched openings and avoid etch stop of etched openings having aspect ratios of 5:1 and higher. The process is useful for etching 0.25 micron and smaller contact or via openings and can be carried out in a parallel plate plasma reactor having a showerhead electrode.
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Khajehnouri Keyvan
Mueller George
Nguyen Thomas D.
Lam Research Corporation
Lund Jeffrie R
Powell Alva C
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