Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2006-11-28
2006-11-28
Norton, Nadine (Department: 1765)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S725000, C438S736000
Reexamination Certificate
active
07141505
ABSTRACT:
A method for etching a bilayer resist defined over a substrate in a plasma etch chamber is provided. The method initiates with introducing the substrate having a pattern defined on a first layer of the bilayer resist into the etch chamber. Then SiCl4gas flows into the etch chamber. Next, a plasma is struck in the etch chamber while flowing the SiCl4gas. Then the bilayer resist is etched.
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Lee Chris
Nguyen Wendy
Lam Research Corporation
Martine & Penilla & Gencarella LLP
Norton Nadine
Tran Binh X.
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