Method and structure for picosecond-imaging-circuit-analysis...

Details Method and structure for picosecond-imaging-circuit-analysis... Method and structure for picosecond-imaging-circuit-analysis...

2007-12-11

2007-12-11

Tu, Christine T. (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

10780878

ABSTRACT:
A method (and structure) of at least one of testing, diagnosing, and monitoring an operation of an electronic circuit, includes interrupting a clock signal used to provide a clocking for a normal operation of the circuit and using a second clock signal to repeatedly cycle through a predetermined cycle of operations for the circuit.

REFERENCES:
patent: 5701308 (1997-12-01), Attaway et al.
patent: 6687866 (2004-02-01), Fukuda
patent: 2004/0083412 (2004-04-01), Corbin et al.

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