4. Measuring and testing
  5. Surface and cutting edge testing
  6. Roughness

Rudolf Ludeke

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Differential force microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Method and structure for high performance phase change memory

Static information storage and retrieval – Systems using particular element – Resistive
Reexamination Certificate

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Profile ID: LFUS-PAI-P-760559

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