Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-01-10
2006-01-10
Decady, Albert (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S718000
Reexamination Certificate
active
06986086
ABSTRACT:
An inventive device for simultaneous testing of a plurality of integrated circuits is described. Each integrated circuit of the plurality of integrated circuits includes a test mode, wherein a test sequence is executed in the integrated circuits, as well as a pin for outputting test data produced in the test mode. The device includes a plurality of test interfaces adapted to be connected with the pin of the plurality of integrated circuits, for receiving the test data of the plurality of integrated circuits, an interface adapted to be connected to a synchronization interface of an integrated reference circuit, wherein a test sequence is executed which is identical with the test sequence of the plurality of integrated circuits, for receiving a synchronization signal which is synchronous with the test sequence, and synchronization means for synchronizing the simultaneous testing on the basis of the synchronization signal of the integrated reference circuit.
REFERENCES:
patent: 5260949 (1993-11-01), Hashizume et al.
patent: 6081916 (2000-06-01), Whetsel, Jr.
patent: 6304987 (2001-10-01), Whetsel, Jr.
patent: 6311300 (2001-10-01), Omura et al.
patent: 6370665 (2002-04-01), Noguchi
patent: 6578180 (2003-06-01), Tanner
patent: 6618827 (2003-09-01), Benavides
patent: 198 53 069 (2000-01-01), None
Alphonse Fritz
De'cady Albert
Greenberg Laurence A.
Infineon - Technologies AG
Locher Ralph E.
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