Method and device for simultaneous testing of a plurality of...

Details Method and device for simultaneous testing of a plurality of... Method and device for simultaneous testing of a plurality of...

2006-01-10

2006-01-10

Decady, Albert (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S718000

Reexamination Certificate

active

06986086

ABSTRACT:
An inventive device for simultaneous testing of a plurality of integrated circuits is described. Each integrated circuit of the plurality of integrated circuits includes a test mode, wherein a test sequence is executed in the integrated circuits, as well as a pin for outputting test data produced in the test mode. The device includes a plurality of test interfaces adapted to be connected with the pin of the plurality of integrated circuits, for receiving the test data of the plurality of integrated circuits, an interface adapted to be connected to a synchronization interface of an integrated reference circuit, wherein a test sequence is executed which is identical with the test sequence of the plurality of integrated circuits, for receiving a synchronization signal which is synchronous with the test sequence, and synchronization means for synchronizing the simultaneous testing on the basis of the synchronization signal of the integrated reference circuit.

REFERENCES:
patent: 5260949 (1993-11-01), Hashizume et al.
patent: 6081916 (2000-06-01), Whetsel, Jr.
patent: 6304987 (2001-10-01), Whetsel, Jr.
patent: 6311300 (2001-10-01), Omura et al.
patent: 6370665 (2002-04-01), Noguchi
patent: 6578180 (2003-06-01), Tanner
patent: 6618827 (2003-09-01), Benavides
patent: 198 53 069 (2000-01-01), None

Affiliated with

Also associated with

Rating

Method and device for simultaneous testing of a plurality of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and device for simultaneous testing of a plurality of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for simultaneous testing of a plurality of... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3602707