Method and circuit for testing a chip

Details Method and circuit for testing a chip Method and circuit for testing a chip

2006-08-08

2006-08-08

Decady, Albert (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S030000, C714S031000, C714S727000, C714S734000, C714S799000

Reexamination Certificate

active

07089472

ABSTRACT:
A circuit for testing a chip. The chip has an intellectual product circuit module, and the circuit has a multiplexer controller, several registers and a MUX finite state machine controller to configure these registers in different states according to the test patterns. In the next state, a test activating signal is provided to the intellectual product circuit module. The intellectual product circuit module is then operated and tested according to the output of the registers.

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