Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2006-09-05
2006-09-05
Lamarre, Guy (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S025000, C714S724000, C714S738000, C703S013000
Reexamination Certificate
active
07103812
ABSTRACT:
A method for testing the correct behavior of an integrated circuit includes forming a list of potential data sharing locations, collecting memory access statistics of the potential data sharing locations, and forming subsequent test case threads to test specialized processing conditions of the integrated circuit based on the memory access statistics of the potential data sharing locations.
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Maly John W.
Thompson Ryan C.
Hewlett--Packard Development Company, L.P.
Lamarre Guy
Trimmings John P.
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