Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2005-09-13
2005-09-13
Ton, David (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S724000
Reexamination Certificate
active
06944810
ABSTRACT:
In order to test the input and output drivers of a circuit, in particular an integrated semiconductor circuit, a method and apparatus is provided to connect the input or output drivers assigned to individual signal connections of the circuit to be tested in series to a ring oscillator or to an open chain with the oscillation of the ring oscillator or the delay time being evaluated. By providing appropriate controllable switches, the configuration of the ring oscillator or the chain can be altered variably depending on the input or output drivers to be tested respectively. In this way an “at-speed” and “leakage” test of all input and output drivers, including the external signal connections, are possible with all of these having to be connected to a rapid test unit.
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Oberle Hans-Dieter
Sattler Sebastian
Infineon Technologies AG.
Marshall & Gerstein & Borun LLP
Ton David
LandOfFree
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