Method and apparatus for the testing of input/output drivers...

Details Method and apparatus for the testing of input/output drivers... Method and apparatus for the testing of input/output drivers...

2005-09-13

2005-09-13

Ton, David (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S724000

Reexamination Certificate

active

06944810

ABSTRACT:
In order to test the input and output drivers of a circuit, in particular an integrated semiconductor circuit, a method and apparatus is provided to connect the input or output drivers assigned to individual signal connections of the circuit to be tested in series to a ring oscillator or to an open chain with the oscillation of the ring oscillator or the delay time being evaluated. By providing appropriate controllable switches, the configuration of the ring oscillator or the chain can be altered variably depending on the input or output drivers to be tested respectively. In this way an “at-speed” and “leakage” test of all input and output drivers, including the external signal connections, are possible with all of these having to be connected to a rapid test unit.

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