Method and apparatus for testing electronic components

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C710S107000

Reexamination Certificate

active

06973607

ABSTRACT:
An apparatus and a method for testing one or more processors. The apparatus and method provide a host computer that issues test case information. The test case information is translated from the architecture used by a host computer to the architecture required by the electronic components. The processors are then able to perform the test case.

REFERENCES:
patent: 4811345 (1989-03-01), Johnson
patent: 5263139 (1993-11-01), Testa et al.
patent: 5604888 (1997-02-01), Kiani-Shabestari et al.
patent: 6484281 (2002-11-01), Wang et al.
patent: 6643803 (2003-11-01), Swoboda et al.
patent: 6877053 (2005-04-01), Lahiri et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for testing electronic components does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for testing electronic components, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for testing electronic components will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3520548

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.