Method and apparatus for testing delay faults

Details Method and apparatus for testing delay faults Method and apparatus for testing delay faults

2008-08-06

2011-12-06

Kerveros, James C (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

08074133

ABSTRACT:
An apparatus or method for testing of a SOC processor device may minimize interference that is caused by interfacing a comparatively low-speed testing device with the high-speed processor during testing. Implementations may gate the input clock signal at the clock input to each domain of the SOC processor device rather than at the output of the PLL clock. The gating of the clock signal to each domain may then be controlled by clock stop signals generated by the testing device and sent to the individual domains of the processor device. Gating the clock signal at the domain may provide a more natural state for the circuit during testing as well as allow the test control unit to test the different domains of the SOC device individually.

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