4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Thomas A. Ziaja

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At-speed scan testing of memory arrays

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Automatic generation and validation of memory test models

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Method and apparatus for testing delay faults

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2785094

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